論文- 清水 康雄 -
表示方法: 表示形式: 表示順:
件数:72件
[2019]
1.Outstanding tensile properties of a precipitation-strengthened FeCoNiCrTi0.2 high-entropy alloy at room and cryogenic temperatures.[Acta Materialia,165,(2019),228-240]Y. Tong, D. Chen, B. Han, J. Wang, R. Feng, T. Yang, C. Zhao, Y. L. Zhao, W. Guo, Y. Shimizu, C. T. Liu, P. K. Liaw, K. Inoue, Y. Nagai, A. Hu, and J. J. Kai
10.1016/j.actamat.2018.11.049
[2018]
2.Effect of carbon on boron diffusion and clustering in silicon: Temperature dependence study.[Journal of Applied Physics,124(15),(2018),155702/1-155702/8]Y. Tu, Y. Shimizu, Y. Kunimune, Y. Shimada, T. Katayama, T. Ide, M. Inoue, F. Yano, K. Inoue, and Y. Nagai
10.1063/1.5048313
3.Direct observation of deuterium trapping at irradiation-induced vacancy clusters in tungsten by positron annihilation spectroscopy.[IMR KINKEN Research Highlights 2018,(2018),19]Y. Nagai, K. Inoue, Y. Shimizu, and K. Nagumo
4.Industrial application of atom probe tomography to semiconductor devices.[Scripta Materialia,148,(2018),82-90]A. D. Giddings, S. Koelling, Y. Shimizu, R. Estivill, K. Inoue, W. Vandervorst, and W. K. Yeoh
10.1016/j.scriptamat.2017.09.004
5.Composition evolution of gamma prime nanoparticles in the Ti-doped CoFeCrNi high entropy alloy.[Scripta Materialia,148,(2018),42-46]B. Han, J. Wei, Y. Tong, D. Chen, Y. Zhao, J. Wang, F. He, T. Yang, C. Zhao, Y. Shimizu, K. Inoue, Y. Nagai, A. Hu, C.-T. Liu, and J.-J. Kai
10.1016/j.scriptamat.2018.01.025
6.Blocking of deuterium diffusion in poly-Si/Al2O3/HfxSi1-xO2/SiO2 high-k stacks as evidenced by atom probe tomography.[Applied Physics Letters,112(3),(2018),032902/1-032902/5]Y. Tu, B. Han, Y. Shimizu, Y. Kunimune, Y. Shimada, T. Katayama, T. Ide, M. Inoue, F. Yano, K. Inoue, and Y. Nagai
10.1063/1.5010256
[2017]
7.Nanoscopic analysis of oxygen segregation at tilt boundaries in silicon ingots using atom probe tomography combined with TEM and ab initio calculations.[Journal of Microscopy,268(3),(2017),230-238]Y. Ohno, K. Inoue, K. Fujiwara, K. Kutsukake, M. Deura, I. Yonenaga, N. Ebisawa, Y. Shimizu, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, and M. Kohyama
10.1111/jmi.12602
8.Atom probe tomographic assessment of the distribution of germanium atoms implanted in a silicon matrix through nano-apertures.[Nanotechnology,28(38),(2017),385301/1-385301/7]Y. Tu, B. Han, Y. Shimizu, K. Inoue, Y. Fukui, M. Yano, T. Tanii, T. Shinada, and Y. Nagai
10.1088/1361-6528/aa7f49
9.1.54 μm photoluminescence from Er:Ox centers at extremely low concentration in silicon at 300 K.[Optics Letters,42(17),(2017),3311-3314]M. Celebrano, L. Ghirardini, M. Finazzi, Y. Shimizu, Y. Tu, K. Inoue, Y. Nagai, T. Shinada, Y. Chiba, A. Abdelghafar, M. Yano, T. Tanii, and E. Prati
10.1364/OL.42.003311
10.Atom probe analysis of silicon nanocrystals embedded in silicon dioxide matrix.[IMR KINKEN Research Highlights 2017,(2017),32]Y. Shimizu, Y. Nagai, and K. Inoue
11.Atom probe study of erbium and oxygen co-implanted silicon.[Silicon Nanoelectronics Workshop (SNW), 2017,(2017),99-100]Y. Shimizu, Y. Tu, A. Abdelghafar, M. Yano, Y. Suzuki, T. Tanii, T. Shinada, E. Prati, M. Celebrano, M. Finazzi, L. Ghirardini, K. Inoue, and Y. Nagai
10.23919/SNW.2017.8242316
12.Revisiting room-temperature 1.54 μm photoluminescence of ErOx centers in silicon at extremely low concentration.[Silicon Nanoelectronics Workshop (SNW), 2017,(2017),105-106]E. Prati, M. Celebrano, L. Ghirardini, P. Biagioni, M. Finazzi, Y. Shimizu, Y. Tu, K. Inoue, Y. Nagai, T. Shinada, Y. Chiba, A. Abdelghafar, M. Yano, and T. Tanii
10.23919/SNW.2017.8242319
13.Influence of laser power on atom probe tomographic analysis of boron distribution in silicon.[Ultramicroscopy,173,(2017),58-63]Y. Tu, H. Takamizawa, B. Han, Y. Shimizu, K. Inoue, T. Toyama, F. Yano, A. Nishida, and Y. Nagai
10.1016/j.ultramic.2016.11.023
14.Weak-beam scanning transmission electron microscopy for quantitative dislocation density measurement in steels.[Microscopy,66(2),(2017),120-130]K. Yoshida, M. Shimodaira, T. Toyama, Y. Shimizu, K. Inoue, T. Yoshiie, K. J. Milan, R. Gerard, and Y. Nagai
10.1093/jmicro/dfw111
15.Impact of local atomic stress on oxygen segregation at tilt boundaries in silicon.[Applied Physics Letters,110(6),(2017),062105/1-062105/5]Y. Ohno, K. Inoue, K. Fujiwara, K. Kutsukake, M. Deura, I. Yonenaga, N. Ebisawa, Y. Shimizu, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, and M. Kohyama
10.1063/1.4975814
[2016]
16.Boron distributions in individual core-shell Ge/Si and Si/Ge heterostructured nanowires.[Nanoscale,8(47),(2016),19811-19815]B. Han, Y. Shimizu, J. Wipakorn, K. Nishibe, Y. Tu, K. Inoue, N. Fukata, and Y. Nagai
10.1039/C6NR04384D
17.Predoping effects of boron and phosphorous on arsenic diffusion along grain boundaries in polycrystalline silicon investigated by atom probe tomography.[Applied Physics Express,9(10),(2016),106601/1-106601/4]H. Takamizawa, Y. Shimizu, K. Inoue, Y. Nozawa, T. Toyama, F. Yano, M. Inoue, A. Nishida, and Y. Nagai
10.7567/APEX.9.106601
18.Recombination activity of nickel, copper, and oxygen atoms segregating at grain boundaries in mono-like silicon crystals.[Applied Physics Letters,109(14),(2016),142105/1-142105/4]Y. Ohno, K. Kutsukake, M. Deura, I. Yonenaga, Y. Shimizu, N. Ebisawa, K. Inoue, Y. Nagai, H. Yoshida, and S. Takeda
10.1063/1.4964440
19.The diffusivity and solubility of copper in a reactor pressure vessel steel studied by atom probe tomography.[IMR KINKEN Research Highlights 2016,(2016),20]Y. Nagai, K. Inoue, Y. Shimizu, and K. Nagumo
20.Characterization and process development of CVD/ALD-based Cu(Mn)/Co(W) interconnect system.[Proceedings of Advanced Metallization Conference,(2016)]K. Shima, Y. Tu, B. Han, H. Takamizawa, H. Shimizu, Y. Shimizu, T. Momose, K. Inoue, Y. Nagai, and Y. Shimogaki
Page: [1] [2] [3] [4] [next]
戻るこのページのトップへ
copyright(c)2005 Tohoku University