著書論文等- 長 康雄 -
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件数:363件
[2017]
21.[] Two-Dimensional Imaging of Trap Distribution in SiO2/SiC Interface Using Local Deep Level Ttransient Spectroscopy Based on Super-Higher-Order Scanning Nonlinear Dielectric Microscopy.[Materials Science Forum,897,(2017),127-130]Norimichi Chinone, Ryoji Kosugi ,Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, and Yasuo Cho
10.4028/www.scientific.net/MSF.897.127
[2016]
22.[] Two-dimensional local deep level transient spectroscopy imaging using super-higher-order scanning nonlinear dielectric microscopy.[ISTFA2016,(2016)]N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho,
23.[] Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy.[Microelectronics Reliability,64,(2016),566-569]N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho
24.[] Visualization of Gate-Bias-Induced Carrier Redistribution in SiC Power DIMOSFET Using Scanning Nonlinear Dielectric Microscopy.[IEEE TRANSACTIONS ON ELECTRON DEVICES,63(8),(2016),3165-3170]Norimichi Chinone and Yasuo Cho
25.[] TWO-DIMENSIONAL CHARACTERIZATION OF PHOSPHORUS-IMPLANTED EMITTER AND PHOSPHORUS-DIFFUSED EMITTER OF SILICON SOLAR CELL USING SUPER-HIGHER-ORDER SCANNING NONLINEAR DIELECTRIC MICROSCOPY.[32nd European Photovoltaic Solar Energy Conference and Exhibition,(2016),527-530]Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone and Yasuo Cho
26.[] Simultaneous observation of two dimensional electron gas and polarization in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy.[Jpn. J. Appl. Phys.,55,(2016),08NB13-1-08NB13-3]Kotaro Hirose, Yasunori Goto, Norimichi Chinone and Yasuo Cho
27.[] 走査型非線形誘電率顕微鏡(SNDM)による半導体微細構造の高分解能評価.[応用物理学会 応用物理,85(7), (2016), 560-567]長 康雄
28.[] Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry.[Jpn. J. Appl. Phys,,(55),(2016),08NB02-1-08NB02-5]Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Maki Suemitsu and Yasuo Cho
10,7567/JJAP.55.08NB02
29.[] High-density ferroelectric recording using a hard disk drive-type data storage system.[JOURNAL OF APPLIED PHYSICS,119,(2016),184101-1-184101-8]Tomonori Aoki, Yoshiomi Hiranaga, and Yasuo Cho
10.1063/1.4948940
30.[] Nondestructive and local evaluation of SiO2/SiC interface using super-higher-order scanning nonlinear dielectric microscopy22.[Materials Science Forum,858,(2016),469-472]Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada,Hajime Okumura, and Yasuo Cho
10.4028/www.scientific.net/MSF.858.469
31.[] Visualization of polarization and two dimensional electron gas distribution in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy.[Materials Science Forum,858,(2016),1182-1185]Kotaro Hirose, Norimichi Chinone, and Yasuo Cho
10.4028/www.scientific.net/MSF.858.1182
[2015]
32.[] Visualization and analysis of active dopant distribution in a p-i-n structured amorphous silicon solar cell using scanning nonlinear dielectric microscopy.[AIP ADVANCES,5,(2015),097136-1-097136-7]K. Hirose, N. Chinone, and Y. Cho
10.1063/1.4931028
33.[] Scanning nonlinear dielectric Potentiometry.[REVIEW OF SCIENTIFIC INSTRUMENTS,86,(2015),093704-1-093704-8]Kohei Yamasue and Yasuo Cho
10.10631/1.4931028
34.[] Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2 × 1 surface by non-contact scanning nonlinear dielectric microscopy.[APPLIED PHYSICS LETTERS,107,(2015),03604-1-031604-5]Masataka Suzuki, Kohei Yamasue,and Yasuo Cho
10.1063/14927244
35.[] Interfacial Charge States in Graphene on Sic Studied by Noncontact Scanning Nonlinear Dielectric Potentiometry.[PHYSICAL REVIEW LETTERS,114,(2015),226103-1-226103-5]Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu and Yasuo Cho
10.1103/PhysRevLett.114.226103
36.[] A-site-driven ferroelectricity in strained ferromagnetic La2NiMnO6 thin films.[PHYSICAL REVIEW B,91,(2015),134107-1-134107-9]R. Takahashi, I. Ohkubo, K. Yamauchi, M. Kitamura, Y. Sakurai, M. Oshima, T. Oguchi, Y. Cho, and M. Lippmaa
10.1103/PhysRevB.91.134107
37.[] 走査型非線形誘電率顕微鏡法(SNDM)-次世代パワーデバイス(SiC, GaN& Si系パワーデバイス及び太陽電池,etc.)評価用最強ツールとして-”.[ナノエレクトロニクス計測分析技術研究会 分析サロン,7, (2015), 1-6]長康雄
38.[] Interfacial capacitance between a ferroelectric Fe3 O4 thin film and a semiconducting Nb:SrTiO3 substrate.[JOURNAL OF APPLIED PHYSICS,117,(2015),014104-1-014104-10]R. Takahashi,Y. Cho, and M. Lippmaa
[2014]
39.[] A New Atomically Resolved Potentiometry for Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy.[ecoss30,(2014)]Kohei Yamasue,Yasuo Cho
40.[] Pb (Zr, Ti)O3 recording media for probe data storage devices prepared by rf magnetron sputtering3#D#DR.[Jpn. J. Appl. Phys,,53(9S),(2014),09PA05-1-09PA05-5]Yoshiomi Hiranaga and Yasuo Cho
10.7567/JJAP.53.09PA05
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