著書論文等- 長 康雄 -
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件数:365件
[2002]
261.[] 超高分解能走査型非線形誘電率顕微鏡.[応用物理学会 応用物理,71(1), (2002), 62-65]長 康雄
262.[] Scanning Nonlinear Dielectric Microscopy -A high resolution tool for observing ferroelectric domains and nano-domain engineering-.[Integrated Ferroelectrics,50,(2002),189-198]Yasuo Cho
263.[] Study on surface layer formed on LiNbO3 single crystal using higher order nonlinear dielectric microscopy.[Proceedings of the tenth international meeting on ferroelectricity (IMF-10),269,(2002),207-212]Y. Cho, K. Ohara and H. Odagawa
264.[] Study on the periodically poled LiNbO3 for high performance QPM devices using scanning nonlinear dielectric microscopy.[Proceedings of the tenth international meeting on ferroelectricity (IMF-10),273,(2002),223-228]Y. Cho, S. Kazuta and H. Ito
265.[] NANO-SIZED INVERTED DOMAIN FORMATION IN STOICHIOMETRIC LiTaO3 SINGLE CRYSTAL USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY.[Integrated Ferroelectrics,49,(2002),203-209]Yoshiomi Hiranaga, Kenjiro Fujimoto, Yasuo Cho, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe and Kenji Kitamura
266.[] Quantitative Measurement of Dielectric Properties Using Scanning Nonlinear Dielectric Microscopy with Electo-conductive Cantilever.[Integrated Ferroelectrics,50,(2002),209-217]Koya Ohara and Yasuo Cho
[2001]
267.[] Microscopic Observation of the Temperature Coefficient Distribution of Microwave Materials Using Scanning Electron-Beam Dielectric Microscopy.[Journal of the European Ceramic Society,21(15),(2001),2735-2738]Y. Cho, A. Satoh and H. Odagawa
268.[] Nano Domain Engineering Using Scanning Nonlinear Dielectric Microscopy.[Proceedings of the 2001 Ist IEEE Conference on Nanotechnology,(2001),352-357]Yasuo Cho, Kaori Matsuura, Satoshi Kazuta, Hiroyuki Odagawa, Kazuya Terabe and Kenji Kitamura
269.[] Higher Order Nonlinear Dielectric Microscopy.[Applied Phisics Letters,79(23),(2001),3842-3844]Yasuo Cho and Koya Ohara
270.[] Scanning nonlinear dielectric microscopy with nanometer resolution.[Journal of the European Ceramic Society,21(10-11),(2001),2131-2134]Yasuo Cho, Satoshi Kazuta, Kaori Matsuura and Hiroyuki Odagawa
271.[] Determination of Crystal Polarities of Piezoelectric Thin Film Using Scanning Nonlinear Dielectric Microscopy.[Journal of the European Ceramic Society,21(10-11),(2001),1581-1584]Satoshi Kazuta, Yasuo Cho and Hiroyuki Odagawa
272.[] Theory of scanning nonlinear dielectric microscopy and application to quantitative evaluation.[Journal of the European Ceramic Society,21(10-11),(2001),2135-2139]Yasuo Cho, Koya Ohara, Satoshi Kazuta and Hiroyuki Odagawa
273.[] Characterization of Ferroelectric Property of C-Axis- and Non-C-Axis-Oriented Epitaxially Grown Bi2Vo5.5 Thin Films.[Japanese Journal of Applied Physics,40(11),(2001),6481-6486]Tomohiro Sakai, Takayuki Watanabe, Yasuo Cho, Kaori Matsuura and Hiroshi Funakubo
274.[] Scanning nonlinear dielectric microscopy study on periodically poled LiNbO3 for high-performance quasi-phase matching devices.[Applied Physics Letters,79(18),(2001),2955-2957]Yasuo Cho, Satoshi Kazuta, and Hiromasa Ito
275.[] Fundamental Study of Surface Layer on Ferroelectrics by Scanning Nonlinear Dielectric Microscopy.[Japanese Journal of Applied Physics,40(9B),(2001),5833-5836]Koya Ohara and Yasuo Cho
276.[] Higher Order Nonlinear Dielectric Imaging Using Scanning Nonlinear Dielectric Microscopy.[Jpanese Journal of Applied Physics,40(6B),(2001),4349-4353]Yasuo CHO and Koya OHARA
277.[] “Fundamental Study on Nano Domain Engineering Using Scanning Nonlinear Dielectric Microscopy.[Japanese Journal of Applied Physics,40(6B),(2001),4354-4356]Kaori MATSUURA, Yasuo CHO and Hiroyuki ODAGAWA
278.[] Measurement of the Ferroelectric Domain Distributions Using Nonlinear Dielectric Response and Piezoelectric Response.[Japanese Journal of Applied Physics,40(5B),(2001),3534-3537]Kaori MATSUURA, Yasuo CHO and Hiroyuki ODAGAWA
279.[] New Functions of Scanning Nonlinear Dielectric Microscopy ~Higher-Order Measurement and Vertical Resolution~.[Japanese Journal of Applied Physics,40(6B),(2001),3544-3548]Yasuo CHO, Koya OHARA, Atsushi KOIKE and Hiroyuki ODAGAWA
280.[] Scanning Electron-Beam Dielectric Microscopy for the Temperature Coefficient Distribution of Dielectric Ceramics.[Analytical Sciences,17,(2001),S63-S66]Yasuo Cho, Osamu Jintsugawa, Akira Satoh, Hiroyuki Odagawa and Kazuhiko Yamanouchi
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