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件数:363件
[2002]
241.[] 非線形誘電率顕微鏡を用いたドメイン構造観察.[シーエムシー出版 機能材料,22(12), (2002), 12-17]長 康雄
242.[] 走査型非線形誘電率顕微鏡による強誘電ドメインの観測.[日本金属学会 まてりあ,41(12), (2002), 852-853]長 康雄
243.[] Ferroelectric nano-domain engineering.[Proceedings of International Symposium on Nano-Intelligent Materials/ System (ISNIMS),(2002),29-34]Yasuo Cho, Kazuya Terabe, Kenji Kitamura
244.[] Tbit/inch2 Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy.[Applied Physics Letters,81(23),(2002),4401-4403]Yasuo Cho, Kenjiro Fujimoto, Yoshiomi Hiranaga, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe , Kenji Kitamura
245.[] Tbit/inch2 data storage using scanning nonlinear dielectric microscopy.[Proceedings of 7th International Symposium on Ferroic Domains and Mesoscopic Structures (ISFD7),(2002),B3TO4-]Y. Cho, K. Fujimoto, Y. Hiranaga, Y. Wagatsuma, A. Onoe, K. Terabe, K. Kitamura
246.[] Tbit/inch2 ferroelectric data storage using SNDM nano domain engineering system.[Proceedings of Trend in Nanotechnology 2002 (TNT2002),(2002),195-196]Yasuo Cho, Kenjiro Fujimoto, Yoshiomi Hiranaga, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura
247.[] Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy.[Proceeding of 7th International Symposium on Ferroic Domains and Mesoscopic Structures (ISFD7),(2002)]Y. Cho, K. Matsuura, N. Valanoor, R. Ramesh
248.[] Tbit/inch2 ferroelectric data storage using scanning nonlinear dielectric microscopy.[Proceedings 2002 2nd IEEE Conference on Nanotechnology (IEEE-NANO 2002),(2002),255-259]Yasuo Cho, Kenjiro Fujimoto, Yoshiomi Hiranaga, Jie Liu, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura
249.[] Development of scanning microwave microscope with high-throughput characterization of combinatorial dielectric materials.[Applied Surface Science,189(3-4),(2002),222-226]Noriaki Okazaki, Hiroyuki Odagawa, Yasuo Cho, Toshihiko Naganuma, Daisuke Komiyama, Takashi Koida, Hideki Minami, Parhat Ahmet, Tomoteru Fukumura, Yuji Mastumoto, Masashi Kawasaki, Toyohiro Chikyow, Hideomi Koinuma , Tetsuya Hasegawa
250.[] Quantitative measurement of linear dielectric constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever.[Japanese Journal of Applied Physics,41(7B),(2002),4961-4964]Koya Ohara,Yasuo Cho
251.[] Observation of ferroelectric nano-domains using scanning nonlinear dielectric imaging and piezoresponse imaging.[Applied Surface Science,188(3-4),(2002),421-424]K. Matsuura,Y. Cho
252.[] Study on surface layer formed on LiNbO3 single crystal using higher order nonlinear dielectric microscopy.[Ferroelectrics,269,(2002),207-212]Yasuo Cho, Koya Ohara,Hiroyuki Odagawa
253.[] Higher Order Nonlinear Dielectric Microscopy.[Porceedings of Material Research Society Sympium,(2002),329-334]Yasuo Cho, Koya Ohara
254.[] 超高分解能走査型非線形誘電率顕微鏡.[応用物理,71(1),(2002),62-65]長 康雄
255.[] Study on the periodically poled LiNbO3 for high performance QPM devices using scanning nonlinear dielectric microscopy.[Ferroelectrics,273,(2002),223-228]Yasuo Cho, Satoshi Kazuta, Hiromasa Itoh
256.[] Measuring ferroelectric polarization component parallel to the surface by scanning nonlinear dielectric microscopy.[Applied Physics Letters,80(12),(2002),2159-2161]Hiroyuki Odagawa,Yasuo Cho
257.[] Nanoscale measurement techniques of three-dimensional ferroelectric polarization using scanning nonlinear dielectric microscopy.[Ferroelectrics,268,(2002),149-154]Hiroyuki Odagawa,Yasuo Cho
258.[] Scanning Electron-Beam Dielectric Microscopy for the Temperature Coefficient Distribution of Dielectric Materials.[Proceedings of Material Reasearch Society Symposium,700,(2002),103-112]Yasuo Cho
259.[] 超高分解能走査型非線形誘電率顕微鏡.[応用物理学会 応用物理,71(1), (2002), 62-65]長 康雄
260.[] Scanning Nonlinear Dielectric Microscopy -A high resolution tool for observing ferroelectric domains and nano-domain engineering-.[Integrated Ferroelectrics,50,(2002),189-198]Yasuo Cho
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