著書論文等- 黒田 理人 -
表示方法: 表示形式: 表示順:
[]:著書 []:論文 []:総説・解説記事
件数:340件
[2017]
61.[] Formation technology of flat surface with epitaxial growth on ion-implanted (100)-oriented Si surface of thin silicon-on-insulator.[Japanese Journal of Applied Physics,56(10),(2017),105503-1-105503-8]Kiichi Furukawa, Akinobu Teramoto, Rihito Kuroda, Tomoyuki Suwa, Keiichi Hashimoto, Shigetoshi Sugawa, Daisuke Suzuki, Yuichiro Chiba, Katsutoshi Ishii, Akira Shimizu, and Kazuhide Hasebe
10.7567/JJAP.56.105503
http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000411291400001&DestApp=WOS
62.[] Experimental Investigation of Localized Stress Induced Leakage Current Distribution in Gate Dielectrics Using Array Test Circuit.[Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials,(2017),785-786]Hyeonwoo Park, Tomoyuki Suwa, Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa
63.[] Analysis of Random Telegraph Noise Behaviors of nMOS and pMOS toward Back Bias Voltage Changing.[Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials,(2017),333-334]Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shinya Ichino, Shigetoshi Sugawa
64.[] Impact of Drain Current to Appearance Probability and Amplitude of Random Telegraph Noise in Low Noise CMOS Image Sensors.[Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials,(2017),331-332]Shinya Ichino, Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Hyeonwoo Park, Takeru Maeda, Shunichi Wakashima, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa
65.[] SNR70dB超のCMOSイメージセンサと半値幅10nmのチューナブルマルチバンドパスフィルタを用いた分光イメージングシステム.[映像情報メディア学会技術報告,41(32(IST2017 49-59)), (2017), 9‐12-12]青柳雄介, 藤原康行, 村田真麻, 那須野悟史, 若嶋駿一, 黒田理人, 寺島康平, 石鍋隆宏, 藤掛英夫, 若生一広, 須川成利
66.[] 画素SFで発生するランダムテレグラフノイズの統計的解析~トランジスタ形状・時定数・遷移数の影響~.[映像情報メディア学会技術報告,41(32(IST2017 49-59)), (2017), 13‐16-16]黒田理人, 寺本章伸, 市野真也, 間脇武蔵, 若嶋駿一, 須川成利
67.[] 高速CMOSイメージセンサ技術の歩み.[映像情報メディア学会年次大会講演予稿集(CD-ROM),2017, (2017), ROMBUNNO.S5‐2-]須川成利, 鈴木学, 鈴木将, 黒田理人
68.[] Cameras with on-chip memory CMOS image sensors.[The Micro-World Observed by Ultra High-Speed Cameras: We See What You Don't See, (2017), 103-124]Rihito Kuroda, Shigetoshi Sugawa
10.1007/978-3-319-61491-5_5
http://www.scopus.com/inward/record.url?eid=85035019025&partnerID=40
69.[] Atomically flat interface for noise reduction in SOI-MOSFETs.[2017 International Conference on Noise and Fluctuations,(2017),7985986-1-7985986-4]Philippe Gaubert, Alexandre Kircher, Hyeonwoo Park, Rihito Kuroda, Tetsuya Goto, Tomoyuki Suwa, Akinobu Teramoto, and Shigetoshi Sugawa
10.1109/ICNF.2017.7985986
http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000426915500062&DestApp=WOS
70.[] Improvement in Electrical Characteristics of ALD Al2O3 Film by Microwave Excited Ar/O2 Plasma Treatment.[232nd ECS Meeting Abstracts,MA2017-01,(2017),1249]Masaya Saito, Tomoyuki Suwa, Akinobu Teramoto, Yasumasa Koda, Rihito Kuroda, Yoshinobu Shiba, Shigetoshi Sugawa, Junichi Tsuchimoto, Marie Hayashi
71.[] 黒田 理人.[(株)技術情報協会,(2017)]野辺 継男、黒田 理人、蚊野 浩、木股 雅章、田村 哲雄、小川 新平、大橋 洋二、青柳 靖、桑原 義彦、亀井 利久、政田 元太、木津 巧一、平尾 朋三、篠塚 哲、馬路 徹、佐藤 智和、緒方 健人、橋本 雅文、西田 健、石沢 千佳子、佐藤 淳、柴田 啓司、加藤 ジェーン、内村 圭一、山口 順一、山口 弘純、渡邊 直幸、片山 硬、伊東 敏夫、花泉 弘、川西 康友、秋田 時彦、山下 隆義、ポンサトーン ラクシンチャラーンサク、山田 啓一、金澤 靖、高取 祐介、小山 善文、小野口 一則、原 孝介、木下 航一、森島 繁生、佐藤 優伍、宇野 新太郎、佐藤 健哉、藤本 暢宏、大柴 小枝子、倉地 亮、齊藤 智明、味岡 恒夫、駒田 隆彦、中山 幸二、
ISBN978-4-86104-658-2
72.[] Statistical Analysis of Random Telegraph Noise in Source Follower Transistors with Various Shapes.[2017 International Image Sensor Workshop,(2017),39-42]Shinya Ichino, Takezo Mawaki, Shunichi Wakashima, Akinobu Teramoto, Rihito Kuroda, Phillipe Gaubert, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa
73.[] A Spectral Imaging System with an Over 70dB SNR CMOS Image Sensor and Electrically Tunable 10nm FWHM Multi-Bandpass Filter.[2017 International Image Sensor Workshop,(2017),47-50]Yasuyuki Fujihara, Yusuke Aoyagi, Satoshi Nasuno, Shunichi Wakashima, Rihito Kuroda, Kohei Terashima, Takahiro Ishinabe, Hideo Fujikake, Kazuhiro Wako and Shigetoshi Sugawa
74.[] Impact of Random Telegraph Noise with Various Time Constants and Number of States in CMOS Image Sensors.[2017 International Image Sensor Workshop,(2017),43-46]Rihito Kuroda, Akinobu Teramoto and Shigetoshi Sugawa
75.[] 10Mfps 960 Frames Video Capturing Using a UHS Global Shutter CMOS Image Sensor with High Density Analog Memories.[2017 International Image Sensor Workshop,(2017),308-311]Manabu Suzuki, Masashi Suzuki, Rihito Kuroda, Yuki Kumagai, Akira Chiba, Noriyuki Miura, Naoya Kuriyama and Shigetoshi Sugawa
76.[] Impact of SiO2/Si Interface Micro-roughness on SILC Distribution and Dielectric Breakdown: A Comparative Study with Atomically Flattened Devices.[Proceedings of the International Reliability Physics Symposium 2017,(2017),DG-7.1-DG-7.5]Hyeonwoo Park, Tetsuya Goto, Rihito Kuroda, Akinobu Teramoto, Tomoyuki Suwa, Daiki Kimoto, Shigetoshi Sugawa
10.1109/IRPS.2017.7936364
http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000416068500113&DestApp=WOS
77.[] 高密度アナログメモリを搭載した超高速グローバルシャッタCMOSイメージセンサ.[映像情報メディア学会技術報告,41(10(IST2017 8-19)), (2017), 7‐10-10]鈴木学, 鈴木将, 黒田理人, 熊谷勇喜, 千葉亮, 三浦規之, 栗山尚也, 須川成利
78.[] A high sensitivity 20Mfps CMOS image sensor with readout speed of 1Tpixel/sec for visualization of ultra-high speed phenomena.[Proceedings of SPIE,10328,(2017),1032802-1-1032802-6]R. Kuroda, S. Sugawa
10.1117/12.2270787
79.[] High Sensitivity and High Readout Speed Electron Beam Detector using Steep pn Junction Si diode for Low Acceleration Voltage.[IS&T International Symposium on Electronic Imaging 2017, Image Sensors and Imaging Systems 2017,11,(2017),14-17]Koda Y, Kuroda R, Hara M, Tsunoda H, Sugawa S.
10.2352/ISSN.2470-1173.2017.11.IMSE-178
80.[] Narrow-bandpass liquid crystal filter for real-time multi spectral imaging systems.[Proceedings of the International Display Workshops,1,(2017),259-261]Terashima K, Ishinabe T, Wako K, Fujihara Y, Aoyagi Y, Murata M, Nasuno S, Wakashima S, Kuroda R, Shibata Y, Sugawa S, Fujikake H.
http://www.scopus.com/inward/record.url?eid=85055975403&partnerID=40
Page: [prev] [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [next]
戻るこのページのトップへ
copyright(c)2005 Tohoku University