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件数:30件
[2017]
1.[] Effect of the film thickness on the crystal structure and ferroelectric properties of (Hf0.5Zr0.5)O2 thin films deposited on various substrates.[Mater. Sci. Semicond. Process,70,(2017),239-245]T. Shiraishi, K. Katayama, T. Yokouchi, T. Shimizu, T. Oikawa, O. Sakata, H. Uchida, Y. Imai, T. Kiguchi, T. J. Konno and H. Funakubo
10.1016/j.mssp.2016.12.008
2.[] Characterization of (111)-oriented epitaxial (K0.5Na0.5)NbO3 thick films deposited by hydrothermal method.[Jpn. J. Appl. Phys.,56,(2017),10PF04-1-10PF04-5]Takahisa Shiraishi, Mutsuo Ishikawa, Hiroshi Uchida, Takanori Kiguchi, Minoru K. Kurosawa, Hiroshi Funakubo and Toyohiko J. Konno
10.7567/JJAP.56.10PF04
3.[] Crystal structure and dielectric / ferroelectric properties of CSD-derived HfO2-ZrO2 solid solution films.[Ceram. Int,43,(2017),S501-S505]C. Abe, S. Nakayama, M. Shiokawa, H. Kawashima, K. Katayama, T. Shiraishi, T. Shimizu, H. Funakubo, and H. Uchida
10.1016/j.ceramint.2017.05.253
4.[] In-situ observation of ultrafast 90° domain switching under application of an electric field in (100)/(001)-oriented tetragonal epitaxial Pb(Zr0.4Ti0.6)O3 thin films.[Sci. Rep.,7(9641),(2017),1-7]Y. Ehara, S. Yasui, T. Oikawa, T. Shiraishi, T. Shimizu, H. Tanaka, N. Kanenko, R. Maran, T. Yamada, Y. Imai, O. Sakata, N.n Valanoor, and H. Funakubo
10.1038/s41598-017-09389-6
5.[] Crystal structure and magnetism in κ−Al2O3-type AlxFe2-xO3 films on SrTiO3(111).[J. Appl. Phys.,122,(2017),015301-]Y. Hamasaki, T. Shimizu, S. Yasui, T. Shiraishi, A. Akama, T. Kiguchi, T. Taniyama, and M. Itoh
10.1063/1.4990947
6.[] The microstructural evolution in high sodium epitaxial sodium potassium niobate films deposited by low-temperature hydro-thermal method.[J. Mater. Sic,52,(2017)]P. S. S. R. Krishnan, T. Shiraishi1, and H. Funakubo
10.1007/s10853-017-0927-7
[2016]
7.[] Growth of (111)-oriented epitaxial and textured ferroelectric Y-doped HfO2 films for.[Appl. Phys. Lett.,(109),(2016),112901-1-112901-5]K. Katayama, T. Shimizu, O. Sakata, T. Shiraishi, S. Nakamura, T. Kiguchi, A. Akama, T. J. Konno, H. Uchida, and H. Funakubo
10.1063/1.4962431
8.[] Solid state epitaxy of (Hf,Zr)O2 thin films with orthorhombic phase.[J. Ceram. Soc. Jpn.,124(6),(2016),689-693]T. KIGUCHI, S. NAKAMURA, A. AKAMA, T. SHIRAISHI and T. J. KONNO
10.2109/jcersj2.16073
9.[] Impact of mechanical stress on ferroelectricity in (Hf0.5Zr0.5)O2 thin films.[Appl. Phys. Lett.,108,(2016),262904-1-262904-5]T. Shiraishi, K. Katayama, T. Yokouchi, T. Shimizu, T. Oikawa, O. Sakata, H. Uchida, Y. Imai, T. Kiguchi, T. J. Konno and H. Funakubo
10.1063/1.4954942
10.[] Large irreversible non-180° domain switching after poling treatment in Pb(Zr, Ti)O3 films.[Appl. Phys. Lett.,108,(2016),212901-1-212901-5]Y. Ehara, S. Yasui, T. Oikawa, T. Shiraishi, N. Oshima, T. Yamada, Y. Imai, O. Sakata and H. Funakubo
10.1063/1.4951672
11.[] Orientation control and domain structure analysis of {100}-oriented epitaxial ferroelectric orthorhombic HfO2-based thin films.[J. Appl. Phys.,119,(2016),134101-1-134101-7]K. Katayama, T. Shimizu, O. Sakata, T. Shiraishi, S. Nakamura, T. Kiguchi, A. Akama, T. J. Konno, H. Uchida, and H. Funakubo
10.1063/1.4945029
12.[] Crystal Structure and Compositional Analysis of Epitaxial (K0.56Na0.44)NbO3 Films Prepared by Hydrothermal Method.[J. Mater. Res.,31,(2016),693-701]T. Shiraishi, H. Einishi, T. Shimizu, M. Kurosawa, H. Uchida, N. Kumada, T. Kiguchi, T. J. Konno and H. Funakubo
10.1557/jmr.2016.56
13.[] Thermally stable dielectric responses in uniaxially (001)-oriented CaBi4Ti4O15 nanofilms grown on a Ca2Nb3O10−nanosheet seed layer.[Sci. Rep.,6,(2016)]J. Kimura, I. Takuwa, M. Matsushima, T. Shimizu, H. Uchida, T. Kiguchi, T. Shiraishi, T. J. Konno, T. Shibata, M. Osada, T. Sasaki and H. Funakubo
10.1038/srep20713
[2015]
14.[] Domain structure of tetragonal Pb(Zr,T)O3 nanorods and its size dependence.[Jpn. J. Appl. Phys.,54,(2015),10NA07-1-10NA07-4]T. Yamada, D. Ito, O. Sakata, J. Kuroishi, T. Namazu, Y. Imai, T. Shiraishi, T. Shimizu, H. Funakubo, M. Yoshino and T. Nagasaki
10.7567/JJAP.54.10NA07
15.[] Negligible substrate clamping effect on piezoelectric response in (111)-epitaxial tetragonal Pb(Zr,Ti)O3 films.[J. Appl. Phys.,118,(2015),072012-1-072012-4]T. Yamada, J. Yasoumoto, D. Ito, O. Sakata, Y. Imai, T, Kiguchi, T. Shiraishi, T. Shimizu, H. Funakubo, M. Yoshino and T. Nagasaki
10.1063/1.4927810
16.[] Vibration-energy-harvesting properties of hydrothermally synthesized (K,Na)NbO3 films deposited on flexible metal foil substrates.[Jpn. J. Appl. Phys.,54,(2015),10ND06-1-10ND06-6]T. Shiraishi, N. Kaneko, M. Kurosawa, H. Uchida, Y. Suzuki, T. Kobayashi and H. Funakubo
10.7567/JJAP.54.10ND06
17.[] Fabrication of tetragonal Pb(Zr,T)O3 nanorods by focused ion beam and characterization the domain structure.[Proc. IEEE-ISAF/ISIF/PFM-2015,(2015),175-177]D. Ito , T. Yamada, O. Sakata, J. Kuroishi, T. Namazu, T. Shiraishi, T. Shimizu, H. Funakubo, M. Yoshino and T. Nagasaki
10.1109/ISAF.2015.7172698
18.[] Epitaxial PbZrxTi1-xO3 Ferroelectric Bilayers with Giant Electromechanical Properties.[Adv. Mater. Interfaces,2,(2015),1-12]H. H. Huang, Q. Zhang, E. Huang, R. Maran, O. Sakata, Y. Ehara, T. Shiraishi, H. Funakubo, P. Munroe and N. Valanoor
10.1002/admi.201500075
19.[] Contribution of oxygen vacancies to the ferroelectric behavior of Hf0.5Zr0.5O2 thin films.[Appl. Phys. Lett.,106,(2015),112904-1-112904-5]T. Shimizu, T. Yokouchi, T. Oikawa, T. Shiraishi, T. Kiguchi, A. Akama, T. J. Konno, A. Gruverman and H. Funakubo
10.1063/1.4915336
[2014]
20.[] Effect of incubation time on preparation of continuous and flat Ru films.[J. Vau. Sci. Technol. A,33,(2014),01A149-1-01A149-6]H. Funakubo, T. Shiraishi, T. Oikawa, M. Hirano, H. Chiba and K. Kawano
10.1116/1.4904494
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