Books, Original Papers & Review Papers- SAITO Riichiro -
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[B]:Books [O]:Original Papers [R]:Review Papers
total:441
[1999]
361.[O] Electronic Structure of Fluorine Doped GraphiteNanoclusters.[J. Phys. Chem. Solid,60,(1999),715-721]R. Saito, M. Yagi, T. Kimura, G. Dresselhaus ,M. S. Dresselhaus
362.[O] Conductance Quantization in Carbon Nanotubes:Neutrionos on Cylinder Surface.[Microelectronic Engineering,47,(1999),421-423]T. ,o, T. Nakanishi, R. Saito
363.[R] ナノチューブの挑む技術.[真空,42, (1999), 711-716]齋藤 理一郎
10.3131/jvsj.42.711
364.[O] Auger de-excitation of the 1.54μ emission of Er- and O-implanted silicon.[Nuclear Instrument , Methods in Physics Research B,161-163,(1999),1080-1084]T. Nakanose, T. Kimura, H. Isshiki, S. Yugo, R. Saito
365.[O] Effects of magnetic field and disorder on the electronic properties of carbon nanotubes.[PHYSICAL REVIEW B,59(7),(1999),5242-5246]Roche S, Saito R
10.1103/PhysRevB.59.5242
http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000078778800105&DestApp=WOS
366.[O] Energy transfer efficiency of the 1.54μm luminescence of Er-implanted silicon in relation to post-implantationannealing and impurity coimplantation.[Nuclear Instrument and Methods in Physics Research B,148,(1999),486-491]T. Kimura, T. Nakanose, W. Wang, H. Isshiki, R. Saito
367.[O] Finite Size Effect on the Raman Spectra of Carbon Nanotubes.[Phys. Rev. B,59(3),(1999),2388-2392]R. Saito, T. Takeya, T. Kimura, G. Dresselhaus ,M. S. Dresselhaus
10.1103/PhysRevB.59.2388
http://ir.library.tohoku.ac.jp/re/handle/10097/52633 http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000078291000123&DestApp=WOS
368.[R] カーボンナノチューブ --- 新材料としての価値 ---.[化学工業,50(1), (1999), 34-41]齋藤 理一郎
[1998]
369.[B] Physical Properties of Carbon Nanotubes.[(1998)]R. Saito, G. Dresselhaus, M. S. Dresselhaus
370.[O] Berry's Phase and Absence of Back Scattering in Carbon Nanotubes.[J. Phys. Soc. Japan,67(8),(1998),2857-2862]T. Ando, T. Nakanishi, R. Saito
10.1143/JPSJ.67.2857
http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000075700500054&DestApp=WOS
371.[R] カーボンチューブが拓く世界.[科学,68(8), (1998), 661-669]齋藤 理一郎
372.[O] Effects of hydrogen plasma treatment on the 1.54umluminescence of erbium-doped poroussilicon.[J. Appl. Phys.,84,(1998),1036-1040]T. Dejima, R. Saito, S. Yugo, H. Isshiki, T. Kimura
http://hdl.handle.net/10097/35305
373.[O] Raman Intensity of Single-Wall CarbonNanotubes.[Phys. Rev. B,57(7),(1998),4145-4153]R. Saito, T. Takeya, T. Kimura, G. Dresselhaus, M. S.Dresselhaus
10.1103/PhysRevB.57.4145
http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000072163300071&DestApp=WOS
374.[O] Carbon Nanotubes.[Physics World,11(1),(1998),33-38]M. S. Dresselhaus, G. Dresselhaus, P. C. Eklund, R. Saito
http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=TohokuUniv&SrcApp=TohokuUniv&DestLinkType=FullRecord&KeyUT=WOS:000071671000031&DestApp=WOS
375.[O] Enhanced Yb3+ related 0.98um emission in poroussilicon and its time decay characteristics.[J. Appl. Phys.,83,(1998),1005-1008]T. Kimura, Y. Nishida, A. Yokoi, R. Saito
http://hdl.handle.net/10097/35304
[1997]
376.[O] Excess Li Ions in a Small Graphite Cluster.[J. Mater.Res.,12,(1997),1367-1375]M. Nakadaira, R. Saito, T. Kimura, G. Dresselhaus, M. S. Dresselhaus
http://hdl.handle.net/10097/46222
377.[B] The 1998 McGraw-Hill Yearbook of Science & Technolog.[McGraw-Hill Book. Co.,(1997)]M. S. Dresselhaus, R. Saito
378.[O] Mechanism for Implantation Induced Interdiffusion atIn0.53.[Mat. Sci. Eng., B,44,(1997),28-32]T. Kimura, M. Saito, S. Tachi, R. Saito, M. Murata, T.Kamiya
[1996]
379.[B] Carbon Nanotubes.[CRC Press, Inc., Florida, USA,(1996)]M. S. Dresselhaus, G. Dresselhaus, P. C. Eklund, R. Saito, M. Endo
380.[O] Multiplet Structurecalculation for Rare Earth Ions.[J. Light , VisualEnvironment,20,(1996),15-19]S. Ito, N. Nameda , R. Saito
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