Books, Original Papers & Review Papers- CHO Yasuo -
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[B]:Books [O]:Original Papers [R]:Review Papers
total:356
[2018]
1.[R] 走査型プローブ顕微鏡(非線形誘電率顕微鏡)を用いたデバイス観察.[公益社団法人日本表面科学会 Vacuum and Surface Science,61(4), (2018), 221-226]Yasuo CHO
10.1380/vss61.221
2.[O] Nanoscale linear permittivity imaging based on scanning nonlinear dielectric microscopy.[Nanotechnology,29(20),(2018),205709-1-205709-9]Yoshiomi Hiranaga, Norimichi Chinone and Yasuo Cho
[2017]
3.[O] Nanosecond microscopy of capacitance at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy.[Appl. Phys. Lett.,111,(2017),163103-1-163103-5]Y. Yamagishi, and Y. Cho
10.1063/1.4999794
4.[O] Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer.[Jpn.J.Appl.Phys,,56,(2017),10PF18-1-10PF18-4]Hiroyuki Odagawa, Koshiro Terada, Yohei Tanaka, Hiroaki Nishikawa, Takahiko Yanagitani, and Yasuo Cho
5.[O] High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy.[Japanese Journal of Applied Physics,56,(2017),100101-1-100101-10]Yasuo Cho
10.7567/JJAP.56.100101
6.[O] Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy and its application to imaging two-dimensional distribution of SiO2/SiC interface traps.[JOURNAL OF APPLIED PHYSICS,122,(2017),105701-1-105701-9]Norimichi Chinone, and Yasuo Cho
10.1063/1.4991739
7.[O] Dynamic observation of ferroelectric domain switching using scanning nonlinear dielectric microscopy.[Japanese Journal of Applied Physics,56(10S),(2017),10PF16-1-10PF16-7]Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo and Yasuo Cho
10.7567/JJAP.56.10PF16
8.[O] Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy.[Japanese Journal of Applied Physics,56(10S),(2017),10PF18-1-10PF18-4]Hiroyuki Odagawa, Koshiro Terada, Yohei Tanaka, Hiroaki Nishikawa, Takahiko Yanagitani, and Yasuo Cho
9.[O] Quantitative Analysis of Active Dopant Distribution and Estimation of Effective Diffusivity in Phosphorus-Implanted Emitter of Si Solar Cell Using Scanning Nonlinear Dielectric Microscopy.[IEEE PVSC-44,(2017)]Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, and Yasuo Cho
10.[O] Evaluation of silicon- and carbon-face SiO2/SiC MOS interface quality based on scanning nonlinear dielectric microscopy.[Appl. Phys. Lett.,111,(2017),061602-1-061602-4]Norimichi Chinone, Alpana Nayak, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, and Yasuo Cho
10.1063/1.4990865
11.[O] Quantitative measurement of active dopant density distribution in phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy.[Appl. Phys. Lett.,111(3),(2017),032101-1-032101-4]K. Hirose, K. Tanahashi, H. Takato, and Y. Cho
10.1063/1.4994813
12.[R] SNDM強誘電体プローブメモリ.[The Magnetics Society of Japan Magnetics Jpn.,12(3), (2017), 109-114]長 康雄
13.[O] Universal Parameter Evaluating SiO2/SiC Interface Quality Based on Scanning Nonlinear Dielectric Microscopy.[Materials Science Forum,897,(2017),159-162]Norimichi Chinone, Alpana Nayak, Ryoji Kosugi ,Yasunori Tanaka, Shinsuke Harada, Yuji Kiuchi, Hajime Okumura, and Yasuo Cho
10.4028/www.scientific.net/MSF.897.159
14.[O] Two-Dimensional Imaging of Trap Distribution in SiO2/SiC Interface Using Local Deep Level Ttransient Spectroscopy Based on Super-Higher-Order Scanning Nonlinear Dielectric Microscopy.[Materials Science Forum,897,(2017),127-130]Norimichi Chinone, Ryoji Kosugi ,Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, and Yasuo Cho
10.4028/www.scientific.net/MSF.897.127
[2016]
15.[O] Two-dimensional local deep level transient spectroscopy imaging using super-higher-order scanning nonlinear dielectric microscopy.[ISTFA2016,(2016)]N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho,
16.[O] Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy.[Microelectronics Reliability,64,(2016),566-569]N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho
17.[O] Visualization of Gate-Bias-Induced Carrier Redistribution in SiC Power DIMOSFET Using Scanning Nonlinear Dielectric Microscopy.[IEEE TRANSACTIONS ON ELECTRON DEVICES,63(8),(2016),3165-3170]Norimichi Chinone and Yasuo Cho
18.[O] TWO-DIMENSIONAL CHARACTERIZATION OF PHOSPHORUS-IMPLANTED EMITTER AND PHOSPHORUS-DIFFUSED EMITTER OF SILICON SOLAR CELL USING SUPER-HIGHER-ORDER SCANNING NONLINEAR DIELECTRIC MICROSCOPY.[32nd European Photovoltaic Solar Energy Conference and Exhibition,(2016),527-530]Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone and Yasuo Cho
19.[O] Simultaneous observation of two dimensional electron gas and polarization in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy.[Jpn. J. Appl. Phys.,55,(2016),08NB13-1-08NB13-3]Kotaro Hirose, Yasunori Goto, Norimichi Chinone and Yasuo Cho
20.[R] 走査型非線形誘電率顕微鏡(SNDM)による半導体微細構造の高分解能評価.[応用物理学会 応用物理,85(7), (2016), 560-567]長 康雄
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