Original Papers- SAITO Yoshiaki -
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[2004]
101.Future Tunnel Magnetoresistance Technology for High Density MRAM.[OXFORD KOBE INSTITUTE SEMINOR, 2004,(2004)]Y. Saito, H. Sugiyama, K. Inomata
[2003]
102.Improved thermal stability of ferromagnetic tunnel junctions with a CoFe/CoFeOx/CoFe pinned layer.[IEEE Trans. Magn.,39,(2003),2797-2799]T. Ochiai, N. Tezuka, K. Inomata, S. Sugimoto, Y. Saito
103.A fully integrated 1 kb magnetoresistive random access memory with a double magnetic tunnel junction.[Jpn. J. Appl. Phys.,42,(2003),L745-L747]S. Ikegawa, Y. Asao, Y. Saito, S. Takahashi, T. Kai, K. Tsuchida, H. Yoda
10.1143/JJAP.42.L745
104.Improved thermal stability of ferromagnetic tunnel junctions with a CoFe/CoFeOx/CoFe pinned layer.[(2003) Digests of the Intermag Conference,1230636,(2003),ES05-]T. Ochiai, N. Tezuka, K. Inomata, S. Sugimoto, Y. Saito
10.1109/INTMAG.2003.1230636
105.Junction area scaling and statistical description of dc breakdown of ferromagnetic tunnel junctions.[J. Appl. Phys.,93,(2003),9316-9320]K. Nakajima, Y. Asao, Y. Saito
10.1063/1.1569975
106.Activation energy of the interdiffusion at AlOx/Co-Fe/Ir-Mn interfaces.[Matrial research Science 2003 (2003MRS-J),(2003)]Y. Saito, T. Takahashi, M. Amano, T. Kishi, K. Nishiyama, H. Yoda, S. Tahara
107.MRAM technology using ferromagnetic double tunnel junctions and advanced technology trend for MRAM.[International Colloquium on Magnetic Films and Surfaces, 2003,(2003)]Y. Saito, T. Kishi, M. Amano, S. Takahashi, T. Ueda, K. Nishiyama and H. Yoda
108.ピン層にCoFe/CoFeOx/CoFeを用いた強磁性トンネル接合の耐熱性の改善.[日本応用磁気学会誌,27,(2003),307-310]落合隆夫, 手束展規, 猪俣浩一郎, 杉本諭, 斉藤好昭
10.3379/jmsjmag.27.307
[2002]
109.Characterization and modeling of tunnel barrier reliability.[(2002) Digests of the Intermag Conference,1000782,(2002),BB06-]K. Nakajima, M. Amano, M. Sagoi, Y. Saito
10.1109/INTMAG.2002.1000782
[2001]
110.Effect of bias voltage and interdiffusion in Ir-Mn exchange-biased double tunnel junctions.[IEEE Trans. Magn.,37,(2001),1979-1981]Y. Saito, M. Amano, K. Nakajima, S. Takahashi, M. Sagoi, K. Inomata
10.1109/20.951027
111.Bias voltage and annealing-temperature dependences of magnetoresistance ratio in Ir-Mn exchange-biased double tunnel junctions.[J. Magn. Magn. Mater.,223,(2001),293-298]Y. Saito, M. Amano, K. Nakajima, S. Takahashi, M. Sagoi
10.1016/S0304-8853(00)01270-1
112.Characteristics of annealed dual spin-valve type ferromagnetic double tunnel junctions.[J. Magn. Soc. Jpn.,25,(2001),775-778]M. Amano, Y. Saito, K. Nakajima, T. Takahashi, K. Inomata
10.3379/jmsjmag.25.775
[2000]
113.Magnetoresistance oscillations in double ferromagnetic tunnel junctions with layered ferromagnetic nanoparticles.[IEEE Trans. Magn.,36,(2000),2806-2808]K. Nakajima, Y. Saito, S. Nakamura, K. Inomata
10.1109/20.908595
114.Correlation between barrier width, barrier height, and DC bias voltage dependences on the magnetoresistance ratio in Ir-Mn exchange biased single and double tunnel junctions.[Jpn. J. Appl. Phys.,39,(2000),L1035-L1038]Y. Saito, M. Amano, K. Nakajima, S. Takahashi, M. Sagoi, K. Inomata
115.Double tunnel junctions for magnetic random access memory devices.[J. Appl. Phys.,87,(2000),6064-6066]K. Inomata, Y. Saito, K. Nakajima, M. Sagoi
10.1063/1.372613
116.Magnetoresistance oscillations in double ferromagnetic tunnel junctions with layered ferromagnetic.[(2000) Digests of the Intermag Conference,(2000),GB-03-]K. Nakajima, Y. Saito, S. Nakamura, K. Inomata
117.Ir-Mn Exchange Biased Double Tunnel Junctions.[Advanced Heterostructure workshop (AHW), 2000,(2000)]Y. Saito
118.Tunnel magnetoresistance in double junctions with layered ferromagnetic nanoparticles.[J. Magn. Soc. Jpn.,24,(2000),575-578]K. Nakajima, Y. Saito, S. Nakamura, K. Inomata
10.3379/jmsjmag.24.575
[1999]
119.Spin-dependent tunneling in double tunnel junctions with a discontinuous intermediate layer.[IEEE Trans. Magn.,35,(1999),2904-2906]Y. Saito, K. Nakajima, K. Tanaka, K. Inomata
10.1109/20.801020
120.Spin-dependent tunneling in double tunnel junctions with a discontinuous intermediate layer.[IEEE International Magnetics Conference (Intermag 1999),(1999)]Y. Saito, K. Nakajima, K. Tanaka, K. Inomata
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