Original Papers- FUJIWARA Kohei -
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[2010]
41.Spatial Redistribution of Oxygen Ions in Oxide Resistance Switching Device after Forming Process.[Jpn. J. Appl. Phys.,49(6 1),(2010),060215-]T. Yajima, K. Fujiwara, A. Nakao, T. Kobayashi, T. Tanaka, K. Sunouchi, Y. Suzuki, M. Takeda, K. Kojima, Y. Nakamura, K. Taniguchi, and H. Takagi
10.1143/JJAP.49.060215
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42.V-V dimerization effects on bulk-sensitive hard x-ray photoemission spectra for Magneacuteli phase vanadium oxides.[Phys. Rev. B,81(11),(2010),113107-]M. Obara, A. Sekiyama, S. Imada, J. Yamaguchi, T. Miyamachi, T. Balashov, W. Wulfhekel, M. Yabashi, K. Tamasaku, A. Higashiya, T. Ishikawa, K. Fujiwara, H. Takagi, and S. Suga
10.1103/PhysRevB.81.113107
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43.Anomalous State Sandwiched between Fermi Liquid and Charge Ordered Mott-Insulating Phases of Ti4O7.[Phys. Rev. Lett.,104(10),(2010),106401-]M. Taguchi, A. Chainani, M. Matsunami, R. Eguchi, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, S. Tsuda, S. Watanabe, C.-T. Chen, Y. Senba, H. Ohashi, K. Fujiwara, Y. Nakamura, H. Takagi, and S. Shin
10.1103/PhysRevLett.104.106401
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[2009]
44.Electrode-Geometry Control of the Formation of a Conductive Bridge in Oxide Resistance Switching Devices.[Appl. Phys. Express,2(8),(2009),081401-]K. Fujiwara, T. Yajima, Y. Nakamura, M. J. Rozenberg, and H. Takagi
10.1143/APEX.2.081401
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45.Inhomogeneous chemical states in resistance-switching devices with a planar-type Pt/CuO/Pt structure.[Appl. Phys. Lett.,95(1),(2009),012110-]R. Yasuhara, K. Fujiwara, K. Horiba, H. Kumigashira, M. Kotsugi, M. Oshima, and H. Takagi
10.1063/1.3175720
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[2008]
46.Resistance Switching and Formation of a Conductive Bridge in Metal/Binary Oxide/Metal Structure for Memory Devices.[Jpn. J. Appl. Phys.,47(8),(2008),6266-6271]K. Fujiwara, T. Nemoto, M. J. Rozenberg, Y. Nakamura, and H. Takagi
10.1143/JJAP.47.6266
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[2003]
47.Accumulation and depletion layer thicknesses in organic field effect transistors.[Jpn. J. Appl. Phys.,42(12A),(2003),L1408-L1410]M. Kiguchi, M. Nakayama, K. Fujiwara, K. Ueno, T. Shimada, and K. Saiki
10.1143/JJAP.42.L1408
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