Original Papers- UCHIKOSHI Masahito -
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[2014]
21.Study on the Effect of Melt Convection on Phase Separation Structures in Undercooled CuCo Alloys Using an Electromagnetic Levitator Superimposed with a Static Magnetic Field.[Metall. Mat. Trans. B,45B,(2014),1439-1445]K.Sugioka, T.Inoue, T.Kitahara, R.Kurosawa, M.Kubo, T.Tsukada, M.Uchikoshi, H.Fukuyama
22.POLARIZATION CHARACTERISTICS OF TIN ELECTROREFINING IN CHLORIDE SOLUTIONS.[Materials Science and Engineering,39(2),(2014),103-113]GERGELY B. TÓTH,MASAHITO UCHIKOSHI,TAMÁS KÉKESI
23.Low-Temperature Oxidation of Cu(100), Cu(110) and Cu(111).[Oxidation of Metals,82(3-4),(2014),181-193]Kensuke Fujita Kusano,Masahito Uchikoshi,Kouji Mimura,Minoru Isshiki
10.1007/s11085-014-9486-3
24.Az ón katódos leválását befolyásoló polarizációs jellemzõk potenciodinamikus vizsgálata sósavas ón-klorid oldatokban.[Kohászat,147,(2014),52-56]Gergely B. Tóth, Masahito Uchikoshi, Tamás Kékesi
[2013]
25.Effects of carbon and oxygen on Fe-C-O melt surface tension.[ISIJ International,53(8),(2013),1315-1319]K. Morohishi, M. Uchikoshi, M. Isshiki, H. Fukuyama
26.Boron removal by dissolution and recrystallization of silicon in a sodium-silicon solution.[Separation and Purification Technology,118,(2013),723-726]Haruhiko Morito, Masahito Uchikoshi, Hisanori Yamane
27.Formation of Si grains from a NaSi melt prepared by reaction of SiO2 and Na.[Journal of Crystal Growth,377,(2013),66-71]Hisanori Yamane, Haruhiko Morito, Masahito Uchikoshi
28.New model for low-temperature oxidation of copper single crystal.[Applied Surface Science,276(1),(2013),347-358]Kensuke Fujita, Daisuke Ando, Masahito Uchikoshi, Kouji Mimura, Minoru Isshiki
[2012]
29.Characterization of Microstructure and Mechanical Properties of High-Purity Iron Added with Copper..[J. of the Korean Society for Heat Treatment,25(1),(2012),22-26]Osamu Taguchi, Su Yeon Lee, M.Uchikoshi, Minoru Isshiki, ChanGyu Lee, Shigeru Suzuki, Vladimir S. Gornakov
30.Low-temperature Purification of Silicon by Dissolution and Solution Growth in Sodium Solvent.[Silicon,4,(2012),121-125]H. Morito, T. Karahashi, M. Uchikoshi, M. Isshiki, H. Yamane
31.Anion-Exchange Separation of Zr from Hf using Multi-Column Method.[T.T. Chen Honorary Symposium on Hydrometallurgy, Electrometallurgy and Materials Characterization,(2012),303-314]M. Uchikoshi, K. Mimura, M. Isshiki
[2011]
32.Noncontact Laser Modulation Calorimetry for High-Purity Liquid Iron.[Japanese Journal of Applied Physics,50,(2011),11RD04-1-11RD04-6]K.Sugie, H.Kobatake, M.Uchikoshi, M.Isshiki, K.Sugioka, T.Tsukada, H.Fukuyama
33.Anion-Exchange behavior of Hf(IV) and Zr(IV) in HCl Solutions.[Fray International Symposium Metals and Materials Processing in a Clean Environment,6,(2011),269-281]Masahito Uchikoshi, Kouji Mimura, Minoru Isshiki
34.Anion-Exchange Behavior of Hf(IV) and Zr(IV) in HCI Solutions.[Fray International Symposium ON METALS AND MATERIALS PROCESSING IN A CLEAN ENVIRONMENT,6,(2011),269-282]Masahito Uchikoshi, Kouji Mimura, Minoru Isshiki
35.Surface Tension of Liquid Iron as Functions of Oxygen Activity and Temperature.[ISIJ International,51(10),(2011),1580-1586]K.Morohoshi, M.Uchikoshi, M. Isshiki, H.Fukuyama
36.Preparation of high purity metals for advanced devices.[Thin Solid Films,519(24),(2011),8451-8455]Minoru Isshiki, Kouji Mimura, Masahito Uchikoshi
37.Anion-exchange Behavior of Mo(V) and W(VI) in HCl Solutions.[High Temperature Materials and Processes,30(4),(2011),345-352]Masahito Uchikoshi, Tadasuke Nagahara, Jae-Won Lim, Sang-Bae Kim, Kouji Mimura, Minoru Isshiki
38.Investigation of the Low Resistivity Cu Wire Formation in the 8 Inch Wafer Using Ultra-High Purity Plating Materials.[日本金属学会誌,75(7),(2011),386-391]Suguru Tashiro, Hiroyuki Kadota, Masahiko Ito, Masahito Uchikoshi, Kouji Mimura, Minoru Isshiki, Jin Onuki
39.陽電子プローブマイクロアナライザーによる塑性変形した純鉄の空孔型欠陥マップ.[鉄と鋼,97(5),(2011),266-272]藤浪真紀,河島祐二,柳響介,神野智史,打越雅仁,一色実,鈴木茂
[2010]
40.Fabrication of Porous High-Purity Iron with Directional Pores by Continuous Zone Melting Technique.[Materials Transactions,51(11),(2010),2076-2079]S. K. Hyun, M. Uchikoshi, K. Mimura, M. Isshiki, H. Nagajima
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