Researchers Information
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Books, Original Papers & Review Papers
Name
HONJO Hiroaki
Affiliation
Center for Innovative Integrated Electronic Systems
Research and Development Division
Title
Professor
Research Fields
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    Original Papers

    Impact of tungsten sputtering condition on magnetic and transport properties of double-MgO magnetic tunneling junction.[IEEE Transaction on Magnetics,(2017)]H. Honjo, S. Ikeda, H. Sato, K. Nishioka, T.Watanabe, S. Miura, T. Nasuno, Y. Noguchi,M. Yasuhira, T.Tanigawa, H. Koike, H. Inoue, M. Muraguchi, M.Niwa, H. Ohno, and T. Endoh1
    10.1109/TMAG.2017.2701838


    Improvement of thermal tolerance of CoFeB-MgO perpendicular-anisotropy magnetic tunnel junctions by controlling boron composition.[IEEE Transaction on Magnetics,(2016)]H. Honjo, S. Ikeda, H. Sato, S. Sato, T. Watanabe,S. Miura, T. Nasuno, Y. Noguchi,M.Yasuhira,T.Tanigawa, H. Koike, M. Muraguchi, M. Niwa, K. Ito, H. Ohno and T. Endoh


    Origin of variation of shift field via annealing at 400oC in a perpendicular-anisotropy magnetic tunnel junction with [Co/Pt]-multilayers based synthetic ferrimagnetic reference layer.[AIP Advances,(2016)]H. Honjo, S. Ikeda, H. Sato, T. Watanebe, S. Miura, T. Nasuno, Y. Noguchi, M. Yasuhira, T. Tanigawa, H. Koike, M. Muraguchi, M. Niwa, K. Ito, H. Ohno and T. Endoh


    10 nm perpendicular anisotropy CoFeB-MgO magnetic tunnel junction with over 400oC high thermal tolerance by boron diffusion control.[2015 Symposia on VLSI technology,(2015)]H. Honjo, H. Sato, S. Ikeda, S. Sato, T. Watanebe, S. Miura, T. Nasuno, Y. Noguchi, M. Yasuhira, T. Tanigawa, H. Koike, M. Muraguchi, M. Niwa, K. Ito, H. Ohno, T. Endoh


    Change in chemical bonding state by thermal treatment in MgO-based magnetic tunnel junction observed by angle-resolved hard X-ray photoelectron spectroscopy.[Journal of Applied Physics,125(203903),(2019)]Masaaki Niwa, Akira Yasui, Eiji Ikenaga, Hiroaki Honjo, Shoji Ikeda, Tetsuya Nakamura, and Tetsuo Endoh
    10.1063/1.5094067


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    Review Papers

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    Honours, Awards and Prizes
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      Updated on
      2019.05.26
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